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Bulletin of University of Osaka Prefecture. Series A, Engineering and natural sciences >
Vol. 44, No. 2 >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10466/8624

Title: Nondestructive Internal Observation with High Resolution Using Metal-Oxide-Semiconductor LSI Chip as a Specimen
Authors: Kobayashi, Mutsuo
Takenoshita, Hiroshi
Okuda, Masahiro
Issue Date: 31-Mar-1996
Publisher: 大阪府立大学
Citation: Bulletin of University of Osaka Prefecture. Series A, Engineering and natural sciences. 1996, 44(2), p.79-81
URI: http://hdl.handle.net/10466/8624
Appears in Collections:Vol. 44, No. 2

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